
S. Dass and V. Nair (2003) "EdgeDetection, Spatial
Smoothing and Image Reconstruction with Partially Observed Multivariate Data,"
Journal of the American Statistical Association, Vol. 98, pp. 7789.

V. Nair, L. Escobar, and M. Hamada (2003) "Design and
Analysis of Experiments for Reliability Assessment and Improvement,"
Chapter in Mathematical Reliability: An Expository Perspective,
edited by Mazzuchi, Singpurwaala, and Soyer, Kluewer Academic Publishers
(to appear).

V. Nair and L. Xu (2002) "Optimal Design of Experiments
for Modeling Processes with Feedback Control Variables,"
Journal of Statistical Planning
and Inference Vol. 113, pp. 269284.

V. Nair, W. Taam and Q. Ye (2002)
"Analysis of Functional Responses from Robust Design Experiments,"
Journal of Quality Technology pp 355370.

W. Jiang, H. Wu, F. Tsung, V. Nair, and K. Tsui (2002)
"PIDBased Control Charts for Process Monitoring," Technometrics
Vol. 44, pp. 204215.

W. Brenneman and V. Nair (2001) "Methods for Identifying Dispersion Effects in
Unreplicated Factorial Experiments:
A Critical Analysis and Proposed Strategies,"
Technometrics , Vol.43, pp 388405.

V. Nair, B. Tang, and L. Xu (2001) "Bayesian Inference for Some Mixutre
Models in Reliability,"
Journal of Quality Technology Vol.33, pp. 1627.

V. Nair, M. Hansen, and J. Shi (2000) "Statistics in Advanced Manufacturing,"
JASA pp. 10021005.

F. Tsung, H. Wu, and V. Nair (1998) "On the Efficiency
and Robustness of Discrete ProportionalIntegral Control Schemes"
Technometrics , Vol.40, pp. 214220.

V. Nair, D. James, W. Ehrlich, J. Zevallos, J. (1998),
"A Statistical Assessment of Some Software Testing Strategies and
Application of Experimental Design Techniques,"
Statistica Sinica pp. 165184.

J. Bérubé and V. Nair (1998) "Exploiting
the Inherent Structure in Robust Parameter Design Experiments,
Statistica Sinica, pp. 4366.

W. Ehrlich, V. Nair, M. Alam, W. Chen. and M. Engel, (1998)
"Software Reliability Assessment Using Accelerated Testing Methods,"
Journal of the Royal Statistics Society, Series C  Applied Statistics,
pp. 1530.

O. Patterson, P. Khargonekar, D. Grimard,
X. Dong, and V. Nair (1997)
"Empirical Modeling of Reactive Ion Etching for Reduction of Variance via
Robust Design,
RealTime Feedback and RuntoRun Control,"
The Proceedings of the Second International
Symposium on Process Control, Diagnostics, and Modeling in Semiconductor
Manufacturing, edited by M. Meyyappan, D.J. Economou and S.W.Butler,
Vol. 979, The Electrochemical Society, Inc., pp. 4554.

M. Hansen, V. Nair, and D. Friedman (1997)
"Monitoring
Wafer Map Data in Integrated Circuit Fabrication for Spatially Clustered
Defects," Technometrics, Vol.39, pp 241253.

M. Lunani, V. Nair, and G. Wasserman (1997)
"Graphical Methods for Robust Design with Dynamic Characteristics,"
Journal of Quality Technology Vol29, pp. 327338.

D. Friedman, M. Hansen, V. Nair, and D. James (1997)
"ModelFree Estimation of Defect Clustering in Integrated Circuit
Fabrication,"
IEEE Transactions on Semiconductor
Manufacturing, Vol.10, pp. 344359