• S. Dass and V. Nair (2003) "Edge-Detection, Spatial Smoothing and Image Reconstruction with Partially Observed Multivariate Data," Journal of the American Statistical Association, Vol. 98, pp. 77-89.



• V. Nair, L. Escobar, and M. Hamada (2003) "Design and Analysis of Experiments for Reliability Assessment and Improvement," Chapter in Mathematical Reliability: An Expository Perspective, edited by Mazzuchi, Singpurwaala, and Soyer, Kluewer Academic Publishers (to appear).



• V. Nair and L. Xu (2002) "Optimal Design of Experiments for Modeling Processes with Feedback Control Variables,"
  Journal of Statistical Planning and Inference Vol. 113, pp. 269-284.



• V. Nair, W. Taam and Q. Ye (2002) "Analysis of Functional Responses from Robust Design Experiments,"
  Journal of Quality Technology pp 355-370.



• W. Jiang, H. Wu, F. Tsung, V. Nair, and K. Tsui (2002) "PID-Based Control Charts for Process Monitoring," Technometrics Vol. 44, pp. 204-215.



• W. Brenneman and V. Nair (2001) "Methods for Identifying Dispersion Effects in Unreplicated Factorial Experiments:
  A Critical Analysis and Proposed Strategies," Technometrics , Vol.43, pp 388-405.



• V. Nair, B. Tang, and L. Xu (2001) "Bayesian Inference for Some Mixutre Models in Reliability," Journal of Quality Technology Vol.33, pp. 16-27.



• V. Nair, M. Hansen, and J. Shi (2000) "Statistics in Advanced Manufacturing," JASA pp. 1002-1005.



• F. Tsung, H. Wu, and V. Nair (1998) "On the Efficiency and Robustness of Discrete Proportional-Integral Control Schemes" Technometrics , Vol.40, pp. 214-220.



• V. Nair, D. James, W. Ehrlich, J. Zevallos, J. (1998), "A Statistical Assessment of Some Software Testing Strategies and Application of Experimental Design Techniques," Statistica Sinica pp. 165-184.



• J. Bérubé and V. Nair (1998) "Exploiting the Inherent Structure in Robust Parameter Design Experiments, Statistica Sinica, pp. 43-66.



• W. Ehrlich, V. Nair, M. Alam, W. Chen. and M. Engel, (1998) "Software Reliability Assessment Using Accelerated Testing Methods," Journal of the Royal Statistics Society, Series C -- Applied Statistics, pp. 15-30.



• O. Patterson, P. Khargonekar, D. Grimard, X. Dong, and V. Nair (1997) "Empirical Modeling of Reactive Ion Etching for Reduction of Variance via Robust Design, Real-Time Feedback and Run-to-Run Control," The Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing, edited by M. Meyyappan, D.J. Economou and S.W.Butler, Vol. 97-9, The Electrochemical Society, Inc., pp. 45-54.



• M. Hansen, V. Nair, and D. Friedman (1997) "Monitoring Wafer Map Data in Integrated Circuit Fabrication for Spatially Clustered Defects," Technometrics, Vol.39, pp 241-253.



• M. Lunani, V. Nair, and G. Wasserman (1997) "Graphical Methods for Robust Design with Dynamic Characteristics," Journal of Quality Technology Vol29, pp. 327-338.



• D. Friedman, M. Hansen, V. Nair, and D. James (1997) "Model-Free Estimation of Defect Clustering in Integrated Circuit Fabrication," IEEE Transactions on Semiconductor Manufacturing, Vol.10, pp. 344-359